Atomic Force Microscopy as a Valuable Tool in an Innovative Multi-scale and Multi-technique Non-invasive Approach to Surface Cleaning Monitoring

Catarina Cortes Pereira, I.M.P.L.V.O. Ferreira, L.C. Branco, I.C.A. Sandu, T. Busani

Research output: Contribution to journalArticlepeer-review

Original languageUndefined/Unknown
JournalProcedia Chemistry
DOIs
Publication statusPublished - 2013

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