Atomic force microscopy as a valuable tool in an innovative multiscale and multi‐technique non‐invasive approach to surface cleaning monitoring

Original language	English
Pages	1-1
Number of pages	1
Publication status	Published - 18 Jun 2012
Externally published	Yes
Event	YOCOCU 2012: Youth in the Conservation of Cultural Heritage - Antwerpen, Belgium Duration: 18 Jun 2012 → 20 Jun 2012

Conference

Conference	YOCOCU 2012
Country/Territory	Belgium
City	Antwerpen
Period	18/06/12 → 20/06/12

Research output

• 1 Poster

• Surface characterization and enzyme cleaning monitoring using a non-invasive innovative methodology

  Pereira, C. L. C., 2012, p. 1-1. 1 p.

  Research output: Contribution to conference › Poster › peer-review

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Pereira, C. L. C., Ferreira, I., Branco, L., Sandu, I., & Busani, T. (2012). Atomic force microscopy as a valuable tool in an innovative multiscale and multi‐technique non‐invasive approach to surface cleaning monitoring. 1-1. Abstract from YOCOCU 2012, Antwerpen, Belgium.

Pereira, Catarina Luísa Cortes ; Ferreira, Isabel ; Branco, Luís et al. / Atomic force microscopy as a valuable tool in an innovative multiscale and multi‐technique non‐invasive approach to surface cleaning monitoring. Abstract from YOCOCU 2012, Antwerpen, Belgium.1 p.

@conference{a9634eb6b53b43d081d4927780d52403,

title = "Atomic force microscopy as a valuable tool in an innovative multiscale and multi‐technique non‐invasive approach to surface cleaning monitoring",

author = "Pereira, \{Catarina Lu{\'i}sa Cortes\} and Isabel Ferreira and Lu{\'i}s Branco and Irina Sandu and Tito Busani",

year = "2012",

month = jun,

day = "18",

language = "English",

pages = "1--1",

note = "YOCOCU 2012 ; Conference date: 18-06-2012 Through 20-06-2012",

}

Pereira, CLC, Ferreira, I, Branco, L, Sandu, I & Busani, T 2012, 'Atomic force microscopy as a valuable tool in an innovative multiscale and multi‐technique non‐invasive approach to surface cleaning monitoring', YOCOCU 2012, Antwerpen, Belgium, 18/06/12 - 20/06/12 pp. 1-1.

Atomic force microscopy as a valuable tool in an innovative multiscale and multi‐technique non‐invasive approach to surface cleaning monitoring. / Pereira, Catarina Luísa Cortes; Ferreira, Isabel; Branco, Luís et al.
2012. 1-1 Abstract from YOCOCU 2012, Antwerpen, Belgium.

Research output: Contribution to conference › Abstract › peer-review

TY - CONF

T1 - Atomic force microscopy as a valuable tool in an innovative multiscale and multi‐technique non‐invasive approach to surface cleaning monitoring

AU - Pereira, Catarina Luísa Cortes

AU - Ferreira, Isabel

AU - Branco, Luís

AU - Sandu, Irina

AU - Busani, Tito

PY - 2012/6/18

Y1 - 2012/6/18

M3 - Abstract

SP - 1

EP - 1

T2 - YOCOCU 2012

Y2 - 18 June 2012 through 20 June 2012

ER -

Pereira CLC, Ferreira I, Branco L, Sandu I, Busani T. Atomic force microscopy as a valuable tool in an innovative multiscale and multi‐technique non‐invasive approach to surface cleaning monitoring. 2012. Abstract from YOCOCU 2012, Antwerpen, Belgium.