Atomic Force Microscopy as a valuable tool in an innovative multiscale and multi-technique non-invasive approach to surface cleaning monitoring

Idioma original	Undefined/Unknown
Estado da publicação	Publicado - jun. 2012

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Pereira, C. L. C. (2012, jun.). Atomic Force Microscopy as a valuable tool in an innovative multiscale and multi-technique non-invasive approach to surface cleaning monitoring.

Pereira, Catarina Luísa Cortes. / Atomic Force Microscopy as a valuable tool in an innovative multiscale and multi-technique non-invasive approach to surface cleaning monitoring. 2012.

@misc{a9634eb6b53b43d081d4927780d52403,

title = "Atomic Force Microscopy as a valuable tool in an innovative multiscale and multi-technique non-invasive approach to surface cleaning monitoring",

author = "Pereira, {Catarina Lu{\'i}sa Cortes}",

year = "2012",

month = jun,

language = "Undefined/Unknown",

type = "Other",

}

Pereira, CLC 2012, Atomic Force Microscopy as a valuable tool in an innovative multiscale and multi-technique non-invasive approach to surface cleaning monitoring..

Atomic Force Microscopy as a valuable tool in an innovative multiscale and multi-technique non-invasive approach to surface cleaning monitoring. / Pereira, Catarina Luísa Cortes.
2012.

Resultado de pesquisa › revisão de pares

TY - GEN

T1 - Atomic Force Microscopy as a valuable tool in an innovative multiscale and multi-technique non-invasive approach to surface cleaning monitoring

AU - Pereira, Catarina Luísa Cortes

PY - 2012/6

Y1 - 2012/6

M3 - Other contribution

ER -

Pereira CLC. Atomic Force Microscopy as a valuable tool in an innovative multiscale and multi-technique non-invasive approach to surface cleaning monitoring. 2012.